Structural characterization of organic monolayers on Si〈111〉 from capacitance measurements

Electrochimica Acta

Volumn 45, Issue 20, 2000, Pages 3241-3248

  Allongue, Philippe ^a   Henry De Villeneuve, Catherine ^a   Pinson, Jean ^b  

^a CNRS   (France)

^b UNIVERSITÉ PARIS DIDEROT   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE MEASUREMENT; CRYSTAL ORIENTATION; ELECTRON ENERGY LEVELS; MOLECULAR STRUCTURE; MONOLAYERS; PERMITTIVITY; SILICON WAFERS; SURFACE TREATMENT;

ORGANIC MONOLAYERS;

ORGANIC COATINGS;

EID: 0343826597     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0013-4686(00)00428-X     Document Type: Article

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