Electrical and spectroscopic characterization of metal/monolayer/Si devices

Journal of Physical Chemistry B

Volumn 109, Issue 46, 2005, Pages 21836-21841

  Richter, Curt A ^a   Hacker, Christina A ^a   Richter, Lee J ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALKANE MONOLAYERS; SUBSTRATE BONDING;

DEPOSITION; ELECTRIC CURRENTS; ELECTRIC POTENTIAL; MONOLAYERS; SILICON; SPECTROSCOPIC ANALYSIS;

METALS;

EID: 28944442035     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp053561r     Document Type: Article

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