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Applied Physics A: Materials Science and Processing

Volumn 90, Issue 1, 2008, Pages 175-178

Studies of electrochemically grafted thin organic layers on inorganic surfaces with infrared spectroscopic ellipsometry

(5) Roodenko, K a Rappich, J b Gensch, M a,c Esser, N a Hinrichs, K a

a ISAS INSTITUTE FOR ANALYTICAL SCIENCES (Germany)

b HAHN MEITNER INSTITUT (Germany)

c DESY (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTRA; ELLIPSOMETRY; INFRARED SPECTROSCOPY; MONOLAYERS; SILICON COMPOUNDS;

ELECTROCHEMICAL GRAFTING; ELLIPSOMETRIC SPECTRA; INFRARED SPECTROSCOPIC ELLIPSOMETRY (IRSE); THIN ORGANIC LAYERS;

ULTRATHIN FILMS;

EID: 36049041015 PISSN: 09478396 EISSN: 14320630 Source Type: Journal
DOI: 10.1007/s00339-007-4251-y Document Type: Article

Times cited : (11)

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