Dual frequency modulation with two cantilevers in series: A possible means to rapidly acquire tip-sample interaction force curves with dynamic AFM

Measurement Science and Technology

Volumn 19, Issue 5, 2008, Pages

  Solares, Santiago D ^a   Chawla, Gaurav ^a  

^a UNIVERSITY OF MARYLAND   (United States)

Author keywords

Atomic force microscopy; FAM AFM; FM AFM; Force spectroscopy; Multi frequency; Nanomechanical characterization; Numerical simulation

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; FORCE MEASUREMENT; PARAMETER ESTIMATION;

FORCE SPECTROSCOPY; NANOMECHANICAL CHARACTERIZATION;

FREQUENCY MODULATION;

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; FORCE MEASUREMENT; FREQUENCY MODULATION; PARAMETER ESTIMATION;

EID: 42549132180     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/19/5/055502     Document Type: Article

References (33)