Eliminating bistability and reducing sample damage through frequency and amplitude modulation in tapping-mode atomic force microscopy

Measurement Science and Technology

Volumn 18, Issue 3, 2007, Pages 592-600

  Solares, Santiago D ^a  

^a UNIVERSITY OF MARYLAND   (United States)

Author keywords

AFM control; AFM sample damage; Amplitude modulation atomic force microscopy; Atomic force microscopy; Biological AFM samples; Chemical force microscopy; Frequency modulation; Imaging bistability; Soft AFM samples

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; FREQUENCY MODULATION; IMAGE QUALITY; IMAGING TECHNIQUES; NATURAL FREQUENCIES;

AMPLITUDE-MODULATION ATOMIC FORCE MICROSCOPY; CHEMICAL FORCE MICROSCOPY; IMAGING BISTABILITY;

SURFACE ANALYSIS;

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; FREQUENCY MODULATION; IMAGE QUALITY; IMAGING TECHNIQUES; NATURAL FREQUENCIES; SURFACE ANALYSIS;

EID: 33947406131     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/18/3/007     Document Type: Article

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