Nonlinear dynamics of atomic-force-microscope probes driven in Lennard-Jones potentials

Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences

Volumn 459, Issue 2036, 2003, Pages 1925-1948

  Rützel, Sebastian ^a   Lee, Soo Il ^b   Raman, Arvind ^b  

^a DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

^b PURDUE UNIVERSITY   (United States)

Author keywords

Atomic force microscopy; Nanomechanics; Nonlinear dynamics; Tapping mode

Indexed keywords

POLYSTYRENE; SILICON;

ARTICLE; ATOMIC FORCE MICROSCOPY; MATHEMATICAL ANALYSIS; MATHEMATICAL COMPUTING; MECHANICAL PROBE; SIMULATION;

EID: 12144290263     PISSN: 13645021     EISSN: 14712946     Source Type: Journal    
DOI: 10.1098/rspa.2002.1115     Document Type: Article

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