Photoemission and absorption spectroscopy of carbon nanotube interfacial interaction

Advances in Colloid and Interface Science

Volumn 145, Issue 1-2, 2009, Pages 23-41

  Tran, N H ^a   Wilson, M A ^b   Milev, A S ^a   Bartlett, J R ^a   Lamb, R N ^c   Martin, D ^d   Kannangara, G S K ^a  

^a UNIVERSITY OF WESTERN SYDNEY   (Australia)

^b CSIRO   (Australia)

^c UNIVERSITY OF MELBOURNE   (Australia)

^d UNIVERSITY OF QUEENSLAND   (Australia)

Author keywords

Chemical vapour deposition (CVD); Double walled carbon nanotube (DWCNT); Extended X ray absorption fine structure (EXAFS); Interface; Multi walled carbon nanotube (MWCNT); Near edge X ray absorption fine structure (NEXAFS); Single walled carbon nanotube (SWCNT); Surface; Thin film; X ray photoemission spectroscopy (XPS)

Indexed keywords

ABSORPTION SPECTRA; ABSORPTION SPECTROSCOPY; ATOMIC PHYSICS; CARBON NANOTUBES; CHEMICAL VAPOR DEPOSITION; DEPOSITION; EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; INTERFACES (MATERIALS); NANOPARTICLES; NANOTUBES; PHOTOELECTRON SPECTROSCOPY; SEMICONDUCTOR DOPING; SINGLE-WALLED CARBON NANOTUBES (SWCN); SURFACES; SYNCHROTRON RADIATION; THIN FILMS; X RAY ABSORPTION; YARN;

CHEMICAL VAPOUR DEPOSITION; DOUBLE WALLED CARBON NANOTUBES; EXTENDED X-RAY ABSORPTION FINE STRUCTURES; NEAR EDGE X RAY ABSORPTION FINE STRUCTURE; SINGLEWALLED CARBON NANOTUBE (SWCNT); X RAY PHOTOEMISSION SPECTROSCOPY;

MULTIWALLED CARBON NANOTUBES (MWCN);

EID: 56949093534     PISSN: 00018686     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cis.2008.07.006     Document Type: Review

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