X-ray photoemission spectroscopy study of fluorinated single-walled carbon nanotubes

Applied Physics Letters

Volumn 80, Issue 22, 2002, Pages 4235-4237

  An, Kay Hyeok ^a   Heo, Jeong Goo ^a   Jeon, Kwan Goo ^a   Bae, Dong Jae ^a   Jo, Chulsu ^a   Yang, Cheol Woong ^a   Park, Chong Yun ^a   Lee, Young Hee ^a   Lee, Young Seak ^b   Chung, Young Su ^c  

^a Sungkyunkwan University   (South Korea)

^b Sunchon National University   (South Korea)

^c Samsung Advanced Institute of Technology (SAIT)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRICAL RESISTIVITY MEASUREMENTS; FLUORINE CONCENTRATIONS; FLUORINE CONTENT; HIGH CONCENTRATION; LOW CONCENTRATIONS; REACTION TEMPERATURE; TURBOSTRATIC; X RAY PHOTOEMISSION SPECTROSCOPY;

ATOMIC SPECTROSCOPY; ELECTRIC CONDUCTIVITY; ELECTRONIC STRUCTURE; FLUORINE; PHOTOELECTRON SPECTROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

SINGLE-WALLED CARBON NANOTUBES (SWCN);

EID: 79956033352     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1482801     Document Type: Article

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