Near-edge absorption fine structure and UV photoemission spectroscopy studies of aligned single-walled carbon nanotubes on Si(100) substrates

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 22, Issue 4, 2004, Pages 2000-2004

  Fleming, L ^a   Ulrich, M D ^b   Efimenko, K ^c   Genzer, J ^c   Chan, A S Y ^d   Madey, T E ^d   Oh, S J ^e   Zhou, O ^f   Rowe, J E ^f  

^a NORTH CAROLINA STATE UNIVERSITY   (United States)

^b U S ARMY RESEARCH OFFICE   (United States)

^c North Carolina State University   (United States)

^d RUTGERS UNIVERSITY   (United States)

^e UNIVERSITY OF NORTH CAROLINA   (United States)

^f University of North Carolina at Chapel Hill   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTRA; ANGULAR RESOLUTION; MOLECULAR ELECTRONIC DEVICES (MED); ULTRAVIOLET PHOTOEMISSION SPECTROSCOPY (UPS);

BINDING ENERGY; CHEMICAL VAPOR DEPOSITION; ELECTRONIC STRUCTURE; ETCHING; FIELD EFFECT TRANSISTORS; KINETIC ENERGY; NANOSTRUCTURED MATERIALS; PHOTOEMISSIVE DEVICES; RAMAN SPECTROSCOPY; SEMICONDUCTOR MATERIALS; SPECTRUM ANALYSIS; SYNCHROTRONS; ULTRAVIOLET RADIATION; VECTORS;

CARBON NANOTUBES;

EID: 5044221841     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1775190     Document Type: Conference Paper

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