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Volumn 109, Issue 17, 2005, Pages 8489-8495

Near-edge X-ray absorption fine structure investigations of order in carbon nanotube-based systems

Author keywords

[No Author keywords available]

Indexed keywords

ENTRANCE GRID BIAS (EGB); PARTIAL ELECTRON YIELD (PEY) SIGNALS; POLARIZATION VECTORS; X RAY ABSORPTION;

EID: 18844395368     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp047408t     Document Type: Article
Times cited : (69)

References (40)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.