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Volumn 13, Issue 8, 2008, Pages 732-738
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Effect of crystallography anisotropy of β-tin grains on thermal fatigue properties of Sn-1Ag-0.5Cu and Sn-3Ag-0.5Cu lead free solder interconnects
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Author keywords
Crystallography anisotropy; Grain boundary character distribution; Lead free solder; Orientation imaging microscopy; Sn Ag Cu; Thermal fatigue
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Indexed keywords
ANISOTROPY;
BRAZING;
COPPER;
CRYSTAL GROWTH;
CRYSTAL MICROSTRUCTURE;
CRYSTAL ORIENTATION;
CRYSTALLOGRAPHY;
GRAIN (AGRICULTURAL PRODUCT);
GRAIN BOUNDARIES;
LEAD;
MICROSTRUCTURE;
MINERALOGY;
POWDERS;
RECRYSTALLIZATION (METALLURGY);
SILVER;
SINGLE CRYSTALS;
SOLDERING ALLOYS;
THERMAL FATIGUE;
TITANIUM COMPOUNDS;
WELDING;
CRYSTALLOGRAPHY ANISOTROPY;
GRAIN BOUNDARY CHARACTER DISTRIBUTION;
LEAD FREE SOLDER;
ORIENTATION IMAGING MICROSCOPY;
SN-AG-CU;
TIN;
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EID: 56749132923
PISSN: 13621718
EISSN: 13621718
Source Type: Journal
DOI: 10.1179/136217108X336270 Document Type: Article |
Times cited : (27)
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References (31)
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