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Volumn 13, Issue 8, 2008, Pages 732-738

Effect of crystallography anisotropy of β-tin grains on thermal fatigue properties of Sn-1Ag-0.5Cu and Sn-3Ag-0.5Cu lead free solder interconnects

Author keywords

Crystallography anisotropy; Grain boundary character distribution; Lead free solder; Orientation imaging microscopy; Sn Ag Cu; Thermal fatigue

Indexed keywords

ANISOTROPY; BRAZING; COPPER; CRYSTAL GROWTH; CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; CRYSTALLOGRAPHY; GRAIN (AGRICULTURAL PRODUCT); GRAIN BOUNDARIES; LEAD; MICROSTRUCTURE; MINERALOGY; POWDERS; RECRYSTALLIZATION (METALLURGY); SILVER; SINGLE CRYSTALS; SOLDERING ALLOYS; THERMAL FATIGUE; TITANIUM COMPOUNDS; WELDING;

EID: 56749132923     PISSN: 13621718     EISSN: 13621718     Source Type: Journal    
DOI: 10.1179/136217108X336270     Document Type: Article
Times cited : (27)

References (31)
  • 2
    • 0030150381 scopus 로고    scopus 로고
    • D. R. Frear: JOM, 1996, 48, 49-53.
    • (1996) JOM , vol.48 , pp. 49-53
    • Frear, D.R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.