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Volumn 55, Issue 9, 2007, Pages 3253-3260

Measurement of deformations in SnAgCu solder interconnects under in situ thermal loading

Author keywords

BGA; Grain boundary; Pb free; SnAgCu

Indexed keywords

ANISOTROPY; CRYSTAL ORIENTATION; GRAIN BOUNDARIES; THERMAL LOAD; TIN ALLOYS;

EID: 34247137610     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2007.01.028     Document Type: Article
Times cited : (101)

References (14)
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    • Park SB, Dhakal R, Gao J. Finite Elements analysis of three-dimensionally formed multiple grained SAC interconnects. J Exp Mech, in preparation.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.