SCOPUS 정보 검색 플랫폼

Journal of Applied Physics

Volumn 104, Issue 6, 2008, Pages

Monte Carlo simulation study of scanning electron microscopy images of rough surfaces

(5) Li, Y G a Mao, S F a Li, H M b Xiao, S M a Ding, Z J a

a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA (China)

b UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA (China)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 54749114866 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.2977745 Document Type: Article

Times cited : (47)

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