Bimodal atomic force microscopy imaging of isolated antibodies in air and liquids

Nanotechnology

Volumn 19, Issue 38, 2008, Pages

  Martinez N F ^a   Lozano, J R ^a   Herruzo, E T ^a   Garcia, F ^a   Richter, C ^b   Sulzbach, T ^b   Garcia, R ^a  

^a INSTITUTO DE MICROELECTRÓNICA DE MADRID   (Spain)

^b NANOWORLD SERVICES GMBH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC PHYSICS; ATOMS; LIQUIDS; MICROSCOPIC EXAMINATION; MODULATION; MONOMERS; NUMERICAL METHODS; SCANNING PROBE MICROSCOPY;

ATOMIC FORCE MICROSCOPE; DYNAMIC ATOMIC FORCE MICROSCOPY; FLEXURAL MODES; LOW-QUALITY; STRUCTURAL COMPONENTS;

ATOMIC FORCE MICROSCOPY;

ANTIBODY; CONTRAST MEDIUM; MONOMER;

AIR; AMPLITUDE MODULATION; ANTIBODY ISOLATION; ARTICLE; ATOMIC FORCE MICROSCOPY; EXCITATION; LIQUID; PRIORITY JOURNAL; SENSITIVITY ANALYSIS; THEORETICAL MODEL;

EID: 51349160561     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/19/38/384011     Document Type: Article

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