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Applied Physics Letters

Volumn 92, Issue 15, 2008, Pages

Intermodulation atomic force microscopy

(4) Platz, Daniel a Thoĺn, Erik A a Pesen, Devrim a Haviland, David B a

a ROYAL INSTITUTE OF TECHNOLOGY (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

CANTILEVER BRIDGES; INTERMODULATION; PERTURBATION TECHNIQUES;

CANTILEVER RESPONSE; INTERMODULATION PRODUCTS;

ATOMIC FORCE MICROSCOPY;

EID: 42349116023 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.2909569 Document Type: Article

Times cited : (150)

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