Nanotomography with enhanced resolution using bimodal atomic force microscopy

Applied Physics Letters

Volumn 92, Issue 14, 2008, Pages

  Dietz, C ^a   Zerson, M ^a   Riesch, C ^a   Gigler, A M ^b   Stark, R W ^b   Rehse, N ^a   Magerle, R ^a  

^a CHEMNITZ UNIVERSITY OF TECHNOLOGY   (Germany)

^b UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTALLINE MATERIALS; ETCHING; FEEDBACK; OPTICAL RESOLVING POWER; POLYPROPYLENES; SIGNAL TO NOISE RATIO; TOMOGRAPHY;

CHARACTERISTIC DIFFERENCES; EIGENMODES; ENHANCED RESOLUTION; FEEDBACK SIGNALS;

NANOTECHNOLOGY;

EID: 42149178677     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2907500     Document Type: Article

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