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Volumn , Issue , 2007, Pages 211-233

AlGaN/GaN High Electron Mobility Transistors

Author keywords

AlGaN GaN high electron mobility transistors; Material properties; Nitride semiconductor devices; Physics based simulations

Indexed keywords


EID: 46649085815     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1002/9783527610723.ch10     Document Type: Chapter
Times cited : (9)

References (56)
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    • The software BandEng is a band diagram simulator developed by Michael Grundmann at the University of California at Santa Barbara. It is freely available in
    • The software BandEng is a band diagram simulator developed by Michael Grundmann at the University of California at Santa Barbara. It is freely available in http://my.ece.ucsb.edu/mgrundmann/bandeng.htm
  • 24
    • 84889841955 scopus 로고    scopus 로고
    • http://www.silvaco.com/products/device_simulation/atlas.html
  • 25
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    • http://www.ioffe.rssi.ru/SVA/NSM/Semicond/
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    • Polarization induced electron populations in III-V nitride semiconductors
    • Ph.D. Dissertation, University of California, Santa Barbara
    • D. Jena, Polarization induced electron populations in III-V nitride semiconductors. Transport, growth, and device applications, Ph.D. Dissertation, University of California, Santa Barbara (2003).
    • (2003) Transport, growth, and device applications
    • Jena, D.1
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    • 0003497098 scopus 로고
    • Analysis and Simulation of Semiconductor Devices
    • Springer-Verlag, Wien-New York
    • S. Selberherr, Analysis and Simulation of Semiconductor Devices, Springer-Verlag, Wien-New York (1984).
    • (1984)
    • Selberherr, S.1
  • 54
    • 79953147056 scopus 로고    scopus 로고
    • Understanding materials and process limits for high breakdown voltage AlGaN/GaN HEMTs
    • Ph.D. Dissertation, University of California at Santa Barbara
    • Y. Dora, Understanding materials and process limits for high breakdown voltage AlGaN/GaN HEMTs, Ph.D. Dissertation, University of California at Santa Barbara (2006).
    • (2006)
    • Dora, Y.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.