AlN films on GaN: Sources of error in the photoemission measurement of electron affinity

Journal of Applied Physics

Volumn 89, Issue 3, 2001, Pages 1991-

  Bermudez, V M ^a   Wu, C I ^b,c   Kahn, A ^b  

^a NAVAL RESEARCH LABORATORY   (United States)

^b Princeton University   (United States)

^c INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 18044401316     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1333716     Document Type: Article

References (9)

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