Optical constants of epitaxial AlGaN films and their temperature dependence

Journal of Applied Physics

Volumn 82, Issue 10, 1997, Pages 5090-5096

  Brunner, D ^a   Angerer, H ^a   Bustarret, E ^a   Freudenberg, F ^a   Hopler R ^a   Dimitrov, R ^a   Ambacher, O ^a   Stutzmann, M ^a  

^a WALTER SCHOTTKY INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION EDGES; AL CONTENT; ALGAN FILMS; ALN; BAND GAPS; BOWING PARAMETERS; DISPERSION COEFFICIENT; ENERGY SHIFT; INTERFERENCE FRINGE; KRAMERS-KRONIG DISPERSION; MOLAR FRACTIONS; PHOTON ENERGY; PHOTON ENERGY RANGE; PHOTOTHERMAL DEFLECTION SPECTROSCOPY; PLASMA-INDUCED; ROOM TEMPERATURE; TEMPERATURE DEPENDENCE; WURTZITES;

ABSORPTION; ALUMINUM; ENERGY GAP; EPITAXIAL FILMS; EPITAXIAL GROWTH; GALLIUM NITRIDE; KRAMERS-KRONIG RELATIONS; LIGHT REFRACTION; METALLIC FILMS; MOLECULAR BEAM EPITAXY; MOLECULAR BEAMS; OPTICAL CONSTANTS; PHOTONS; REFRACTIVE INDEX; REFRACTOMETERS; ZINC SULFIDE;

DISPERSION (WAVES);

EID: 1842724516     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.366309     Document Type: Article

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