Harmonic and power balance tools for tapping-mode atomic force microscope

Journal of Applied Physics

Volumn 89, Issue 11 I, 2001, Pages 6473-6480

  Sebastian, A ^a   Salapaka, M V ^a   Chen, D J ^a   Cleveland, J P ^b  

^a Iowa State University of Science and Technology   (United States)

^b United States   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035356416     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1365440     Document Type: Article

References (10)

1. G. Binnig, C. Quate, and C. Gerber, Phys. Rev. Lett. 56, 930 (1986).
2. Q. Zhong, D. Inniss, K. Kjoller, and V. Elings, Surf. Sci. 290, L688 (1993).
3. B. Anczykowski, D. Kruger, K. L. Babcock, and H. Fuchs, Ultramicroscopy 66, 251 (1996).
4. U. Durig, Appl. Phys. Lett. 76, 1203 (2000).
5. J. P. Cleveland, B. Anczykowski, A. E. Schmid, and V. B. Elings, Appl. Phys. Lett. 72, 2613 (1998).
6. M. V. Salapaka, H. S. Bergh, J. Lai, A. Majumdar, and E. McFarland, J. Appl. Phys. 81, 2480 (1997).
7. D. A. Walters, J. P. Cleveland, N. H. Thomson, P. K. Hansma, M. A. Wendman, G. Gurley, and V. Elings, Rev. Sci. Instrum. 67, 3583 (1996).
8. A. Sebastian, M. V. Salapaka, D. J. Chen, and J. P. Cleveland, Proceedings of the American Control Conference, San Diego, CA, 1999.
9. M. V. Salapaka, D. Chen, and J. P. Cleveland, Phys. Rev. B 61, 1106 (2000).
10. D. G. Luenberger, Optimization by Vector Space Methods (Wiley, New York, 1969).