Force interaction in low-amplitude ac-mode atomic forcemicroscopy: Cantilever simulations and comparison with data fromSi(111)7×7

Applied Physics A: Materials Science and Processing

Volumn 66, Issue SUPPL. 1, 1998, Pages

  Erlandsson, R ^a   Olsson, L ^a  

^a LINKÖPING UNIVERSITY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

EXPERIMENTAL DATA; FORCE INTERACTION; INTERACTION FORCES; INTERATOMIC FORCES; LINEAR SPRING; LOW-AMPLITUDE; MORSE FUNCTIONS; NUMERICAL SIMULATION; RESONANCE SPECTRUM; SI (1 1 1); SIMULATED RESONANCE; SURFACE ELASTICITIES; SURFACE SEPARATION; TIP-SURFACE INTERACTION; TUNGSTEN TIP;

ATOMIC FORCE MICROSCOPY; BINDING ENERGY; COMPUTER SIMULATION; ENERGY DISSIPATION; NANOCANTILEVERS; PROBES; RESONANCE; TUNGSTEN; VAN DER WAALS FORCES;

SURFACE TREATMENT;

EID: 24944543412     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s003390051260     Document Type: Article

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