Transient-signal-based sample-detection in atomic force microscopy

Applied Physics Letters

Volumn 83, Issue 26, 2003, Pages 5521-5523

  Sahoo, Deepak R ^a   Sebastian, Abu ^a   Salapaka, Murti V ^a  

^a Iowa State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGING MATERIALS; SIGNAL DEFLECTION;

APPROXIMATION THEORY; ATOMIC FORCE MICROSCOPY; BANDWIDTH; ERROR ANALYSIS; IMAGING TECHNIQUES; LAPLACE TRANSFORMS; OPTICAL RESOLVING POWER; PHOTODIODES; PROBABILITY; PROBLEM SOLVING; THERMAL NOISE; TRANSIENTS;

SIGNAL DETECTION;

EID: 0942288614     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1633963     Document Type: Article

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