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Volumn 96, Issue 3, 2006, Pages
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Chaos in atomic force microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
BIFURCATION (MATHEMATICS);
CHAOS THEORY;
LYAPUNOV METHODS;
MEASUREMENT ERRORS;
TITRATION;
CHAOTIC OSCILLATIONS;
LYAPUNOV EXPONENTS;
OPERATING CONDITIONS;
SYSTEMATIC EXPERIMENTS;
OSCILLATIONS;
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EID: 32644487236
PISSN: 00319007
EISSN: 10797114
Source Type: Journal
DOI: 10.1103/PhysRevLett.96.036107 Document Type: Article |
Times cited : (103)
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References (17)
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