On dual actuation in atomic force microscopes

Proceedings of the American Control Conference

Volumn 4, Issue , 2004, Pages 3128-3133

  El Rifai, Khalid ^a   El Rifai, Osamah ^a   Youcef Toumi, Kamal ^a  

^a NONE   (United States)

Author keywords

AFM control; Dual actuator; Imaging; Nano systems

Indexed keywords

ACTUATORS; CONTROL SYSTEMS; ELECTRIC POTENTIAL; PHOTODETECTORS; THREE TERM CONTROL SYSTEMS;

CANTILEVER DETECTION; DUAL ACTUATORS; MICRO-CANTILEVERS;

ATOMIC FORCE MICROSCOPY;

EID: 8744293608     PISSN: 07431619     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

1. O. M. El Rifai, and K. Youcef-Toumi. Coupling in Piezoelectric Tube Scanners Used in Scanning Probe Microscopes, American Control Conference, Arlington, VA, pp.3251-3255, June 2001.
2. O. M. El Rifai, and K. Youcef-Toumi. Dynamics of Contact-mode Atomic Force Microscopes, American Control Conference, Chicago, IL, pp.2118-2122, June 2000.
3. O. M. El Rifai, and K. Youcef-Toumi. Trade-offs and Performance Limitations in Mechatronic Systems: A Case Study, Annual Reviews in Control, 2, 2004.
4. G.Schitter, P.Menold, H.F. Knapp, F.Allgower, and A.Stemmer. High Perfromance feedback for fast scanning atomic force microscopes. Review of Scientific Instruments, 72(8), August 2001.
5. T. Sulchek, S.C. Minne, J.D. Adams, D.A. Fletcher, A. Atalar, C.F. Quate, and D.M. Adderton. Dual integrated actautors for extended range high speed atomic force microscopy. Applied Physics Letters, 75(11), September 1999.
6. A. Egawa, N. Chiba, K. Homma, K. Chinone, and H. Muramatsu. High-speed scanning by dual feedback control in SNOM/AFM Journal of Microscopy, 194, pp.325-328, May/June 1999.