Making high resolution positioning independent of scan rates: A feedback approach

Applied Physics Letters

Volumn 91, Issue 20, 2007, Pages

  Shegaonkar, Ajit C ^a   Salapaka, Srinivasa M ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; IMAGE ANALYSIS; IMAGE RESOLUTION; SCANNING;

IMAGE SCANNING; SCAN RATES; SUBNANOMETER RESOLUTION;

FEEDBACK;

EID: 36248995143     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2813025     Document Type: Article

References (8)

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