Sample-profile estimate for fast atomic force microscopy

Applied Physics Letters

Volumn 87, Issue 5, 2005, Pages

  Salapaka, Srinivasa ^a   De, Tathagata ^b   Sebastian, Abu ^c  

^a University of Illinois at Urbana Champaign   (United States)

^b Iowa State University of Science and Technology   (United States)

^c IBM RESEARCH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CANTILEVER-TIP SAMPLE FORCE; CONSTANT TIP-SAMPLE FORCE; SAMPLE PROFILES; SAMPLE-PROFILE ESTIMATES;

ATOMIC FORCE MICROSCOPY; BANDWIDTH; MICROSCOPIC EXAMINATION; SCANNING; SIGNAL PROCESSING; TOPOLOGY;

IMAGE RECONSTRUCTION;

EID: 33645507766     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2006213     Document Type: Article

References (7)

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2. G. Schitter, F. Allgower, and A. Stemmer, Rev. Sci. Instrum. 15, 108 (2004).
3. K. Rifai, O. Rifai, and K. Youcef-Toumi, Proceedings of the American Control Conference, Boston, MA, 2004, pp. 3128-3133.
4. G. Schitter, P. Menold, H. F. Knapp, F. Allgower, and A. Stemmer, Rev. Sci. Instrum. 72, 3320 (2001).
5. K. Zhou, J. Doyle, and K. Glover, Robust and Optimal Control (Prentice Hall, Upper Saddle River, NJ, 1996).
6. S. Salapaka, A. Sebastian, J. P. Cleveland, and M. V. Salapaka, Rev. Sci. Instrum. 73, 3232 (2002).
7. S. Salapaka, D. Tathagata, and A. Sebastian, Int. J. Robust Nonlinear Control (to be published).