Off resonance ac mode force spectroscopy and imaging with an atomic force microscope

Applied Surface Science

Volumn 140, Issue 3-4, 1999, Pages 309-313

  Jarvis, S P ^a   Lantz, M A ^a   Durig U ^b   Tokumoto, H ^a  

^a JT RES CENTER FOR ATOM TECHNOLOGY   (Japan)

^b IBM RESEARCH ZURICH   (Switzerland)

Author keywords

07.79.Lh; 61.16.Ch; 62.20. x; Ac mode; APN; Force control; Force spectroscopy; Non contact mode; Tip surface interaction

Indexed keywords

EID: 0040707084     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00546-7     Document Type: Article

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