Harnessing the transient signals in atomic force microscopy

International Journal of Robust and Nonlinear Control

Volumn 15, Issue 16, 2005, Pages 805-820

  Sahoo, Deepak R ^a   Sebastian, Abu ^a   Salapaka, Murti V ^a  

^a Iowa State University of Science and Technology   (United States)

Author keywords

Kalman filter; Likelihood ratio test; Observers

Indexed keywords

BANDWIDTH; IMAGING TECHNIQUES; REAL TIME SYSTEMS;

CANTILEVER PROBES; LIKELIHOOD RATIO TEST; OBSERVERS;

ATOMIC FORCE MICROSCOPY;

EID: 27644528153     PISSN: 10498923     EISSN: None     Source Type: Journal    
DOI: 10.1002/rnc.1025     Document Type: Article

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