Noncontact atomic force microscopy in liquid environment with quartz tuning fork and carbon nanotube probe

Applied Surface Science

Volumn 188, Issue 3-4, 2002, Pages 440-444

  Kageshima, Masami ^a   Jensenius, Henriette ^b   Dienwiebel, Martin ^b   Nakayama, Yoshikazu ^c   Tokumoto, Hiroshi ^a   Jarvis, Suzanne P ^a   Oosterkamp, Tjerk H ^b  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b LEIDEN UNIVERSITY   (Netherlands)

^c Osaka Prefecture University   (Japan)

Author keywords

Carbon nanotube (CNT); Noncontact atomic force microscopy (NC AFM); Octamethylcyclotetrasiloxane (OMCTS); Solvation shell; Tuning fork

Indexed keywords

ASPECT RATIO; ATOMIC FORCE MICROSCOPY; CARBON NANOTUBES; CHEMICAL SENSORS; QUARTZ;

TUNING FORK;

SURFACE CHEMISTRY;

EID: 0037187206     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(01)00975-8     Document Type: Conference Paper

References (16)