Demonstration of low-temperature atomic force microscope with atomic resolution using piezoresistive cantilevers

Review of Scientific Instruments

Volumn 77, Issue 2, 2006, Pages

  Shiraki, Ichiro ^a   Miyatake, Yutaka ^b   Nagamura, Toshihiko ^b   Miki, Kazushi ^a,c  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b Japan Science and Technology Agency   (Japan)

^c UNIVERSITY OF TSUKUBA   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC CONDUCTIVITY; LASER BEAMS; LOW TEMPERATURE EFFECTS; MAGNETOELECTRIC EFFECTS; SILICON;

ATOMIC RESOLUTION; LASER LIGHT; PIEZORESISTIVE CANTILEVERS;

MICROSCOPES;

EID: 33644595227     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2169469     Document Type: Article

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