Pulse-stress dependence of NBTI degradation and its impact on circuits

IEEE Transactions on Device and Materials Reliability

Volumn 8, Issue 1, 2008, Pages 72-78

  Nigam, Tanya ^a  

^a ADVANCED MICRO DEVICES   (United States)

Author keywords

Negative bias temperature instability (NBTI); Relaxation; Ring oscillator (RO)

Indexed keywords

OSCILLATORS (ELECTRONIC); PARAMETER ESTIMATION; RELAXATION PROCESSES; STRESS ANALYSIS; TEMPERATURE MEASUREMENT;

NEGATIVE BIAS TEMPERATURE INSTABILITY (NBTI); RING OSCILLATORS (RO);

MOS DEVICES;

EID: 40549106175     PISSN: 15304388     EISSN: 15304388     Source Type: Journal    
DOI: 10.1109/TDMR.2008.918314     Document Type: Article

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