Behavior of NBTI under AC dynamic circuit conditions

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 2003, Pages 17-22

  Abadeer, W ^a   Ellis, W ^a  

^a IBM MICROELECTRONICS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; DIGITAL CIRCUITS; ELECTRIC SHIELDING; THRESHOLD VOLTAGE;

STRESS CONTROL;

MICROELECTRONICS;

EID: 0037634800     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (16)

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