Carrier lifetime measurement in n- 4H-SiC epilayers

Journal of Applied Physics

Volumn 103, Issue 3, 2008, Pages

  Klein, P B ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; PHOTOCONDUCTIVITY; PHOTOLUMINESCENCE; SILICON CARBIDE;

CARRIER DYNAMICS; CARRIER LIFETIMES; MICROWAVE PHOTOCONDUCTIVITY DECAY.; PHOTOCONDUCTIVITY DECAY;

EPILAYERS;

EID: 39349099950     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2837105     Document Type: Article

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