Investigation of carrier lifetime in 4H-SiC epilayers and lifetime control by electron irradiation

Applied Physics Letters

Volumn 90, Issue 20, 2007, Pages

  Danno, Katsunori ^a   Nakamura, Daisuke ^a   Kimoto, Tsunenobu ^a  

^a KYOTO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER LIFETIME; ELECTRON IRRADIATION; EPILAYERS; MICROWAVES; PHOTOCONDUCTIVITY;

INJECTION LEVEL; LIFETIME CONTROL; RECOMBINATION CENTER; SURFACE RECOMBINATION;

SILICON CARBIDE;

EID: 34249069562     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2740580     Document Type: Article

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