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Volumn 55, Issue 1, 2008, Pages 411-416

Modeling the centroid and the inversion charge in cylindrical surrounding gate MOSFETs, including quantum effects

Author keywords

Gate all around MOSFET (GAA MOSFET); Inversion charge centroid; Inversion charge model; Inversion charge modelling including quantum effects; Silicon on insulator (SOI); Surrounding gate transistor (SGT)

Indexed keywords

GATES (TRANSISTOR); MATHEMATICAL MODELS; POISSON EQUATION; QUANTUM THEORY; SCHRODINGER EQUATION; SILICON ON INSULATOR TECHNOLOGY;

EID: 37749036720     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2007.911096     Document Type: Article
Times cited : (78)

References (30)
  • 2
    • 0028742723 scopus 로고
    • On the universality of inversion layer mobility in Si MOSFET's: Part II - Effects of surface orientation
    • Dec
    • S. Takagi, A. Toriumi, M. Iwase, and H. Tango, "On the universality of inversion layer mobility in Si MOSFET's: Part II - Effects of surface orientation," IEEE Trans. Electron Devices, vol. 41, no. 12, pp. 2363-2368, Dec. 1994.
    • (1994) IEEE Trans. Electron Devices , vol.41 , Issue.12 , pp. 2363-2368
    • Takagi, S.1    Toriumi, A.2    Iwase, M.3    Tango, H.4
  • 4
    • 0032320827 scopus 로고    scopus 로고
    • Random dopant induced threshold voltage lowering and fluctuations in sub-0.1 μm MOSFET's: A 3-D "atomistic" simulation study
    • Dec
    • A. Asenov, "Random dopant induced threshold voltage lowering and fluctuations in sub-0.1 μm MOSFET's: A 3-D "atomistic" simulation study," IEEE Trans. Electron Devices, vol. 45, no. 12, pp. 2505-2513, Dec. 1998.
    • (1998) IEEE Trans. Electron Devices , vol.45 , Issue.12 , pp. 2505-2513
    • Asenov, A.1
  • 6
    • 0037566742 scopus 로고    scopus 로고
    • Frontiers of silicon-on-insulator
    • May
    • G. Celler and S. Cristoloveanu, "Frontiers of silicon-on-insulator," J. Appl. Phys., vol. 93, no. 9, pp. 4955-4978, May 2003.
    • (2003) J. Appl. Phys , vol.93 , Issue.9 , pp. 4955-4978
    • Celler, G.1    Cristoloveanu, S.2
  • 9
    • 0041886632 scopus 로고    scopus 로고
    • Ideal rectangular cross-section Si-Fin channel double-gate MOSFETs fabricated using orientation-dependent wet etching
    • Jul
    • Y. Liu, K. Ishii, T. Tsutsumi, M. Masahara, and E. Suzuki, "Ideal rectangular cross-section Si-Fin channel double-gate MOSFETs fabricated using orientation-dependent wet etching," IEEE Electron Device Lett. vol. 24, no. 7, pp. 484-486, Jul. 2003.
    • (2003) IEEE Electron Device Lett , vol.24 , Issue.7 , pp. 484-486
    • Liu, Y.1    Ishii, K.2    Tsutsumi, T.3    Masahara, M.4    Suzuki, E.5
  • 10
    • 1442287315 scopus 로고    scopus 로고
    • Double gate silicon on insulator transistors. A Monte Carlo study
    • Jun
    • F. Gámiz, J. B. Roldán, A. Godoy, J. E. Carceller, and P. Cartujo, "Double gate silicon on insulator transistors. A Monte Carlo study," Solid State Electron., vol. 48, no. 6, pp. 937-945, Jun. 2004.
    • (2004) Solid State Electron , vol.48 , Issue.6 , pp. 937-945
    • Gámiz, F.1    Roldán, J.B.2    Godoy, A.3    Carceller, J.E.4    Cartujo, P.5
  • 11
    • 17144432609 scopus 로고    scopus 로고
    • Electron mobility in double gate silicon on insulator transistors: Symmetric-gate versus asymmetric-gate configuration
    • Nov
    • F. Gámiz, J. B. Roldán, A. Godoy, P. Cartujo-Cassinello, and J. E. Carceller, "Electron mobility in double gate silicon on insulator transistors: Symmetric-gate versus asymmetric-gate configuration," J. Appl. Phys., vol. 94, no. 9, pp. 5732-5741, Nov. 2003.
    • (2003) J. Appl. Phys , vol.94 , Issue.9 , pp. 5732-5741
    • Gámiz, F.1    Roldán, J.B.2    Godoy, A.3    Cartujo-Cassinello, P.4    Carceller, J.E.5
  • 12
    • 33846035214 scopus 로고    scopus 로고
    • Modeling of surrounding gate MOSFETs with bulk trap states
    • Jan
    • H. Cho and J. Plummer, "Modeling of surrounding gate MOSFETs with bulk trap states," IEEE Trans. Electron Devices, vol. 54, no. 1, pp. 166-169, Jan. 2007.
    • (2007) IEEE Trans. Electron Devices , vol.54 , Issue.1 , pp. 166-169
    • Cho, H.1    Plummer, J.2
  • 13
    • 0034258881 scopus 로고    scopus 로고
    • Analytic description of short-channel effects in fully-depleted double-gate and cylindrical surrounding-gate MOSFETs
    • Sep
    • S. Oh, D. Monroe, and J. M. Hergenrother, "Analytic description of short-channel effects in fully-depleted double-gate and cylindrical surrounding-gate MOSFETs," IEEE Electron Device Lett., vol. 21, no. 9, pp. 445-447, Sep. 2000.
    • (2000) IEEE Electron Device Lett , vol.21 , Issue.9 , pp. 445-447
    • Oh, S.1    Monroe, D.2    Hergenrother, J.M.3
  • 14
    • 9744233646 scopus 로고    scopus 로고
    • Analog performance of the nanoscale double-gate MOSFET near the ultimate scaling limits
    • Nov
    • D. Jiménez, B. Iñinguez, J. Suñe, and J. J. Saez, "Analog performance of the nanoscale double-gate MOSFET near the ultimate scaling limits," J. Appl. Phys., vol. 96, no. 9, pp. 5271-5276, Nov. 2004.
    • (2004) J. Appl. Phys , vol.96 , Issue.9 , pp. 5271-5276
    • Jiménez, D.1    Iñinguez, B.2    Suñe, J.3    Saez, J.J.4
  • 15
    • 26644442791 scopus 로고    scopus 로고
    • A comparative study of electrical characteristic on sub-10-nm double-gate MOSFETs
    • Sep
    • Y. Li and H. Chou, "A comparative study of electrical characteristic on sub-10-nm double-gate MOSFETs," IEEE Trans. Nanotechnol., vol. 4, no. 5, pp. 645-647, Sep. 2005.
    • (2005) IEEE Trans. Nanotechnol , vol.4 , Issue.5 , pp. 645-647
    • Li, Y.1    Chou, H.2
  • 16
    • 0000974699 scopus 로고    scopus 로고
    • Dependence of the electron mobility on the longitudinal electric field in MOSFETs
    • Mar
    • J. B. Roldán, F. Gámiz, J. A. López-Villanueva, and J. E. Carceller, "Dependence of the electron mobility on the longitudinal electric field in MOSFETs," Semicond. Sci. Technol., vol. 12, no. 3, pp. 321-330, Mar. 1997.
    • (1997) Semicond. Sci. Technol , vol.12 , Issue.3 , pp. 321-330
    • Roldán, J.B.1    Gámiz, F.2    López-Villanueva, J.A.3    Carceller, J.E.4
  • 17
    • 4243227379 scopus 로고
    • Monte Carlo study of electron transport in silicon inversion layers
    • Jul
    • M. V. Fischetti and S. E. Laux, "Monte Carlo study of electron transport in silicon inversion layers," Phys. Rev. B, Condens. Matter, vol. 48, no. 4, pp. 2244-2274, Jul. 1993.
    • (1993) Phys. Rev. B, Condens. Matter , vol.48 , Issue.4 , pp. 2244-2274
    • Fischetti, M.V.1    Laux, S.E.2
  • 18
    • 0025682843 scopus 로고
    • Quantum effects in Si n-MOS inversion layer at high substrate concentration
    • Dec
    • Y. Okura, "Quantum effects in Si n-MOS inversion layer at high substrate concentration," Solid State Electron., vol. 33, no. 12, pp. 1581-1585, Dec. 1990.
    • (1990) Solid State Electron , vol.33 , Issue.12 , pp. 1581-1585
    • Okura, Y.1
  • 23
    • 0036475197 scopus 로고    scopus 로고
    • Analytical modeling of quantization and volume inversion in thin Si-film DG MOSFETs
    • Feb
    • L. Ge and J. G. Fossum, "Analytical modeling of quantization and volume inversion in thin Si-film DG MOSFETs," IEEE Trans. Electron Devices vol. 49, no. 2, pp. 287-294, Feb. 2002.
    • (2002) IEEE Trans. Electron Devices , vol.49 , Issue.2 , pp. 287-294
    • Ge, L.1    Fossum, J.G.2
  • 24
    • 0033169528 scopus 로고    scopus 로고
    • A compact double-gate MOSFET model comprising quantum-mechanical and nonstatic effects
    • Aug
    • G. Baccarani and S. Reggiani, "A compact double-gate MOSFET model comprising quantum-mechanical and nonstatic effects," IEEE Trans. Electron Devices, vol. 46, no. 8, pp. 1656-1666, Aug. 1999.
    • (1999) IEEE Trans. Electron Devices , vol.46 , Issue.8 , pp. 1656-1666
    • Baccarani, G.1    Reggiani, S.2
  • 25
    • 0001500805 scopus 로고    scopus 로고
    • Iteration scheme for the solution of the two-dimensional Schrödinger-Poisson equations in quantum structures
    • Jun
    • A. Trellakis, A. T. Galick, A. Pacelli, and U. Ravaioli, "Iteration scheme for the solution of the two-dimensional Schrödinger-Poisson equations in quantum structures," J. Appl. Phys., vol. 81, no. 12, pp. 7880-7884, Jun. 1997.
    • (1997) J. Appl. Phys , vol.81 , Issue.12 , pp. 7880-7884
    • Trellakis, A.1    Galick, A.T.2    Pacelli, A.3    Ravaioli, U.4
  • 26
    • 34247335328 scopus 로고    scopus 로고
    • Quantum-mechanical effects in multiple-gate MOSFETs
    • Sep
    • A. Godoy, A. Ruiz-Gallardo, C. Sampedro, and F. Gámiz, "Quantum-mechanical effects in multiple-gate MOSFETs," J. Comput. Electron., vol. 6, no. 1-3, pp. 145-148, Sep. 2007.
    • (2007) J. Comput. Electron , vol.6 , Issue.1-3 , pp. 145-148
    • Godoy, A.1    Ruiz-Gallardo, A.2    Sampedro, C.3    Gámiz, F.4
  • 27
    • 84920748484 scopus 로고
    • Capacitance modelling for deep submicron thin gate oxide MOSFETs
    • N. D. Arora, R. Rios, and D. A. Antoniadis, "Capacitance modelling for deep submicron thin gate oxide MOSFETs," in Proc. ESSDERC, 1995, pp. 569-572.
    • (1995) Proc. ESSDERC , pp. 569-572
    • Arora, N.D.1    Rios, R.2    Antoniadis, D.A.3
  • 28
    • 20344366540 scopus 로고    scopus 로고
    • Impact of SOI thickness fluctuation on threshold voltage variation in ultra-thin body SOI MOSFETs
    • May
    • G. Tsutsui, M. Saitoh, T. Naguno, and T. Hiramoto, "Impact of SOI thickness fluctuation on threshold voltage variation in ultra-thin body SOI MOSFETs," IEEE Trans. Nanotechnol., vol. 4, no. 3, pp. 369-373, May 2005.
    • (2005) IEEE Trans. Nanotechnol , vol.4 , Issue.3 , pp. 369-373
    • Tsutsui, G.1    Saitoh, M.2    Naguno, T.3    Hiramoto, T.4
  • 29
    • 0035716644 scopus 로고    scopus 로고
    • K. Uchida, J. Koga, R. Ohba, T. Numata, and S. Takagi, Experimental evidences of quantum-mechanical effects on low-field mobility, gate-channel capacitance, and threshold voltage of ultrathin body SOI MOSFETs, in IEDM Tech. Dig., 2001, pp. 29.4.1-29.4.4.
    • K. Uchida, J. Koga, R. Ohba, T. Numata, and S. Takagi, "Experimental evidences of quantum-mechanical effects on low-field mobility, gate-channel capacitance, and threshold voltage of ultrathin body SOI MOSFETs," in IEDM Tech. Dig., 2001, pp. 29.4.1-29.4.4.
  • 30
    • 17644426064 scopus 로고    scopus 로고
    • A new approach to the self-consistent solution of the Schrödinger-Poisson equations in nanowire MOSFETs
    • E. Gnani, S. Reggiani, M. Rudan, and G. Baccarani, "A new approach to the self-consistent solution of the Schrödinger-Poisson equations in nanowire MOSFETs," in Proc. ESSDERC, 2004, pp. 177-180.
    • (2004) Proc. ESSDERC , pp. 177-180
    • Gnani, E.1    Reggiani, S.2    Rudan, M.3    Baccarani, G.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.