X-press: Two-stage X-tolerant compactor with programmable selector

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 27, Issue 1, 2008, Pages 147-158

  Rajski, Janusz ^a,b   Tyszer, Jerzy ^a,c   Mrugalski, Grzegorz ^a,b   Cheng, Wu Tung ^a,b   Mukherjee, Nilanjan ^a,b   Kassab, Mark ^a,b  

^a IEEE   (United States)

^b MENTOR GRAPHICS CORPORATION   (United States)

^c POZNAN UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

Fault diagnosis; Scan based designs; Scan chain selection; Test response compaction; Unknown (X) states

Indexed keywords

SCAN BASED DESIGNS; SCAN CHAIN SELECTION; TEST RESPONSE COMPACTION;

ALGORITHMS; COMPACTION; COMPUTER PROGRAMMING; ERROR ANALYSIS; INTEGRATED CIRCUITS;

FAILURE ANALYSIS;

EID: 37249031445     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAD.2007.907276     Document Type: Article

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