On Compacting Test Response Data Containing Unknown Values

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers

Volumn , Issue , 2003, Pages 855-862

  Wang, Chen ^a   Reddy, Sudhakar M ^b   Pomeranz, Irith ^c   Rajski, Janusz ^a   Tyszer, Jerzy ^d  

^a MENTOR GRAPHICS CORPORATION   (United States)

^b UNIVERSITY OF IOWA   (United States)

^c PURDUE UNIVERSITY   (United States)

^d POZNAN UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

BINOMIAL COEFFICIENTS; FINITE MEMORY COMPACTORS;

BLOCK CODES; COMPUTER HARDWARE; DATA COMPRESSION; DECISION MAKING; ENCODING (SYMBOLS); FLIP FLOP CIRCUITS; GATES (TRANSISTOR); LINEAR SYSTEMS; MATRIX ALGEBRA; PROBABILITY; VECTORS;

VLSI CIRCUITS;

EID: 0346148425     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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