X-press compactor for 1000x reduction of test data

Proceedings - International Test Conference

Volumn , Issue , 2006, Pages

  Rajski, J ^a   Tyszer, J ^b   Mrugalski, G ^a   Cheng, W T ^a   Mukherjee, N ^a   Kassab, M ^a  

^a MENTOR GRAPHICS CORPORATION   (United States)

^b POZNAN UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUITS; LOGIC DESIGN; PROBLEM SOLVING; PROGRAM DIAGNOSTICS;

COMPACTOR OUTPUTS; SELECTION LOGIC; TEST DATA; X STATE PROFILES;

OPTICAL TESTING;

EID: 39749162140     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2006.297643     Document Type: Conference Paper

References (27)