Modular compactor of test responses

Proceedings of the IEEE VLSI Test Symposium

Volumn 2006, Issue , 2006, Pages 242-251

  Rajski, Wojciech ^a   Rajski, Janusz ^b  

^a OREGON STATE UNIVERSITY   (United States)

^b MENTOR GRAPHICS CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BURST ERRORS; SCAN ERRORS;

ERROR ANALYSIS; ERROR DETECTION;

BUILT-IN SELF TEST;

EID: 33751073215     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTS.2006.48     Document Type: Conference Paper

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