8.02 - Experimentation at the Micron and Submicron Scale

Comprehensive Structural Integrity

Volumn 8, Issue , 2007, Pages 41-87

  Chasiotis, I ^a   Knauss, W G ^b  

^a UNIVERSITY OF VIRGINIA   (United States)

^b CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SUBMICRON SCALE;

EID: 36148941253     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1016/B0-08-043749-4/08038-1     Document Type: Chapter

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