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Volumn 6, Issue 3, 1996, Pages 301-309

Determining mean and gradient residual stresses in thin films using micromachined cantilevers

Author keywords

[No Author keywords available]

Indexed keywords

BUCKLING; COMPRESSION TESTING; DEFORMATION; RESIDUAL STRESSES; TENSILE TESTING;

EID: 0030230992     PISSN: 09601317     EISSN: None     Source Type: Journal    
DOI: 10.1088/0960-1317/6/3/002     Document Type: Article
Times cited : (317)

References (20)
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    • (1992) Sensors and Actuators A , vol.35 , pp. 153-159
    • Kiesewetter, L.1    Zhang, J.-M.2    Houdeau, D.3    Steckenborn, A.4
  • 5
    • 0003312415 scopus 로고
    • Mechanical properties of thin films
    • eds L I Maissel and R Glang (New York: McGraw-Hill)
    • Campbell J D S 1970 Mechanical properties of thin films Handbook of Thin Film Technology eds L I Maissel and R Glang (New York: McGraw-Hill)
    • (1970) Handbook of Thin Film Technology
    • Campbell, J.D.S.1
  • 7
    • 33749944166 scopus 로고
    • A simple technique for the determination of mechanical strain in thin films with application to polysilicon
    • Guckel H, Randazzo T and Burns D W 1985 A simple technique for the determination of mechanical strain in thin films with application to polysilicon J. Appl. Phys. 57 1671-75
    • (1985) J. Appl. Phys. , vol.57 , pp. 1671-1675
    • Guckel, H.1    Randazzo, T.2    Burns, D.W.3
  • 10
    • 0001424495 scopus 로고
    • Novel microstructures for the in situ measurement of mechanical properties of thin films
    • Mehregany M, Howe R T and Senturia S D 1987 Novel microstructures for the in situ measurement of mechanical properties of thin films J. Appl. Phys. 62 3579-84
    • (1987) J. Appl. Phys. , vol.62 , pp. 3579-3584
    • Mehregany, M.1    Howe, R.T.2    Senturia, S.D.3
  • 12
    • 0020765912 scopus 로고
    • Polycrystalline silicon micromechanical beams
    • Howe R T and Muller R S 1983 Polycrystalline silicon micromechanical beams J. Electrochem. Soc. 130 1420-3
    • (1983) J. Electrochem. Soc. , vol.130 , pp. 1420-1423
    • Howe, R.T.1    Muller, R.S.2
  • 13
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    • Theoretical modeling of microfabricated beams with elastically restrained supports
    • Meng Q, Mehregany M and Mullen RL 1993 Theoretical modeling of microfabricated beams with elastically restrained supports J. Microelectromechanical System 2 128-37
    • (1993) J. Microelectromechanical System , vol.2 , pp. 128-137
    • Meng, Q.1    Mehregany, M.2    Mullen, R.L.3
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  • 17
    • 0000318788 scopus 로고
    • Influence of surface coatings on elasticity, residual stresses, and fracture properties of silicon microelements
    • Johansson S, Ericson F and Schweitz J 1989 Influence of surface coatings on elasticity, residual stresses, and fracture properties of silicon microelements J. of Appl. Phys. 65 122-8
    • (1989) J. of Appl. Phys. , vol.65 , pp. 122-128
    • Johansson, S.1    Ericson, F.2    Schweitz, J.3
  • 18
    • 0018541427 scopus 로고
    • Youngs modulus measurements of this films using micromechanics
    • Petersen K E and Guarnieri C R 1979 Youngs modulus measurements of this films using micromechanics Journal of Applied Physics 50 6761-5
    • (1979) Journal of Applied Physics , vol.50 , pp. 6761-6765
    • Petersen, K.E.1    Guarnieri, C.R.2
  • 19
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    • Mechanical stability and adhesion of microstructures under capillary forces, I. Basic theory
    • Mastrangelo C H and Hsu C H 1993 Mechanical stability and adhesion of microstructures under capillary forces, I. Basic theory J. Microelectromechanical System 2 33-43
    • (1993) J. Microelectromechanical System , vol.2 , pp. 33-43
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  • 20
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    • Mechanisms of optical activation of micromechanical resonators
    • Fatah RMA 1992 Mechanisms of optical activation of micromechanical resonators Sensors and Actuators A 33 229-36
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    • Fatah, R.M.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.