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Strategies in lithography
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Deep-uv lithography
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J. Vac. Sci. Technol
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Lin, B.J.1
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3
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0016570646
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Replication of 0.1-μm geometries with x-ray lithography
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R. Feder, "Replication of 0.1-μm geometries with x-ray lithography", J. Vac. Sci. Technol. Vol. 12, pp. 1332-1335 1975.
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35048815852
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Pattern generation on wafers using the electron-beam exposure system (EBES)
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Heritage, M.B.1
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9
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0023572806
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The Future of Subhalf-Micrometer Optical Lithography
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33751537236
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33748258054
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The Ending of Optical Lithography and the Prospects of its Successors
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B.J. Lin, "The Ending of Optical Lithography and the Prospects of its Successors", Microelectronic Engineering vol. 83 (2006) pp. 604-613.
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Microelectronic Engineering
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Lin, B.J.1
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35048838889
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Application of Sigma7500 pattern generator to X Architecture and 45-nm generation mask making
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to be published
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Ming-Jiun Yao, Tzu-Yi Wang, Chia-Jen Chen, Hsin-Chang Lee and Yao-Chang Ku, "Application of Sigma7500 pattern generator to X Architecture and 45-nm generation mask making", to be published.
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Utsumi, T.1
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0015381229
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Electromagnetic Near-Field Diffraction of a Medium Slit
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B.J. Lin, "Electromagnetic Near-Field Diffraction of a Medium Slit", J. Opt. Soc. Am., Vol. 62, p. 977-981, 1972.
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J. Opt. Soc. Am
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Lin, B.J.1
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18
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35048861688
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B.J. Lin, Optical Methods for Fine Line Lithography, book chapter from Fine Line Lithography, edited by R. Newman, North-Holland Publishing Co., p. 120, 1980.
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B.J. Lin, "Optical Methods for Fine Line Lithography", book chapter from "Fine Line Lithography", edited by R. Newman, North-Holland Publishing Co., p. 120, 1980.
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19
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0025418311
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A Comparison of Projection and Proximity Printings -From UV to X-Ray
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Elsevier Science Publishers B.V, 1990
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B.J. Lin, "A Comparison of Projection and Proximity Printings -From UV to X-Ray", Microelectronic Engineering vol. 11, p. 137, Elsevier Science Publishers B.V., 1990.
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Microelectronic Engineering
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Lin, B.J.1
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84956127963
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A New Perspective on Proximity Printing - From UV to X-Ray"
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B.J. Lin, "A New Perspective on Proximity Printing - From UV to X-Ray", J. of Vac. Sci. Technol. B, vol. 8, 1990.
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J. of Vac. Sci. Technol. B
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Lin, B.J.1
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21
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0025844392
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Modelling of illumination effects on resist profiles in x-ray lithography
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H.K. Oertel, M. Weiss, H.L. Huber, "Modelling of illumination effects on resist profiles in x-ray lithography", SPIE Proceedings Vol. 1465, p. 244-253, 1991.
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Oertel, H.K.1
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23
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29044435693
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0021117507
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Application of a focused ion-beam system to defect repair of VLSI masks
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25
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19844369720
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E-beam mask repair: Fundamental capability and applications
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0141613095
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Masked ion beam lithography and direct-structuring on curved surfaces
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H. Loeschner, H. Buschbeck, M. Ecker, C. Horner, E. Platzgummer, G. Stengl, M. Zeininger, P. Ruchhoeft, J.C. Wolfe, "Masked ion beam lithography and direct-structuring on curved surfaces", SPIE Proceedings Vol. 5037, p. 156-161, 2003.
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28
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35048824681
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Ion beam dissecting and failure analysis
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(Ion beam dissecting and failure analysis)
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29
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35048832164
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st article for ion beam projection)
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st article for ion beam projection)
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30
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35048844025
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Korean IPL article
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(Korean IPL article)
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31
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35048846886
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Loeschner IPL article
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(Loeschner IPL article)
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32
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35048861687
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Optical Projection Apparatus
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US Patent 4,011,011
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Hemstreet, H.S.1
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84912687160
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Optics in the Model 900 projection stepper
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0035758328
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SVG 157nm Lithograephy technical review
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Fahey, T.1
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37
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35048895620
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ASML 1400 scanner
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ASML 1400 scanner.
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38
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35048886900
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ASML 1900i scanner
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ASML 1900i scanner
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39
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2542495021
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Development of dioptric projection lenses for deep ultraviolet lithography at Carl Zeiss
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W. Ulrich, H.J. Rostalski, R. Hudyma, "Development of dioptric projection lenses for deep ultraviolet lithography at Carl Zeiss", J. Microlith., Microfab., Microsyst., vol. 3, p. 87-96, 2004.
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Ulrich, W.1
Rostalski, H.J.2
Hudyma, R.3
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40
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0036380442
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Semiconductor Foundry, Lithography, and Partners
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B.J. Lin, "Semiconductor Foundry, Lithography, and Partners", SPIE Proceedings Vol. 4688, p. 11, 2002.
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Lin, B.J.1
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33847731467
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B.J. Lin, Lithography for manufacturing of sub-65nm nodes and beyond, IEDM 05-53, pp. 3.1.1-3.1.4, 2005.
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B.J. Lin, "Lithography for manufacturing of sub-65nm nodes and beyond", IEDM 05-53, pp. 3.1.1-3.1.4, 2005.
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42
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25144500983
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Jeng-Horng Chen, Li-Jui Chen, Tun-Yung Fang, Tzung-Chi Fu, Lin-Hung Shiu, Yao-Te Huang, Norman Chen, DaChun Oweyang, Ming-Che Wu, Shih-Che Wang, John C.H. Lin, Chun-Kuang Chen, Wei-Ming Chen, Tsai-Sheng Gau, Burn J. Lin, Richard Moerman, Wendy Gehoel-van Ansem, Eddy van der Heijden, Fred de Johng, Dorrothe, Oorschot, Herman Boom, Martin Hoogendorp, Chrristian Wagner, Bert Koek, Characterization of ArF immersion process for production, SPIE Proceedings, 5754, pp. 13-22, 2005.
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Jeng-Horng Chen, Li-Jui Chen, Tun-Yung Fang, Tzung-Chi Fu, Lin-Hung Shiu, Yao-Te Huang, Norman Chen, DaChun Oweyang, Ming-Che Wu, Shih-Che Wang, John C.H. Lin, Chun-Kuang Chen, Wei-Ming Chen, Tsai-Sheng Gau, Burn J. Lin, Richard Moerman, Wendy Gehoel-van Ansem, Eddy van der Heijden, Fred de Johng, Dorrothe, Oorschot, Herman Boom, Martin Hoogendorp, Chrristian Wagner, Bert Koek, "Characterization of ArF immersion process for production", SPIE Proceedings, Vol. 5754, pp. 13-22, 2005.
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43
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2542455663
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Depth of Focus in Multi-Layered Media - A Long-Neglected Phenomenon Aroused by Immersion Lithography
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B.J. Lin, "Depth of Focus in Multi-Layered Media - A Long-Neglected Phenomenon Aroused by Immersion Lithography", J. Microlith., Microfab., Microsyst., Vol. 3, p 21-27, 2004.
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J. Microlith., Microfab., Microsyst
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Lin, B.J.1
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44
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2542440659
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Simulation of optical projection with polarization-dependent stray light to explore the difference between dry and immersion lithography
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B.J. Lin, "Simulation of optical projection with polarization-dependent stray light to explore the difference between dry and immersion lithography", J. Microlith., Microfab., Microsyst., Vol. 3, p 9-20, 2004.
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(2004)
J. Microlith., Microfab., Microsyst
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Lin, B.J.1
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45
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2542428432
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The Image Characterization of Bubbles in water for 193-nm Immersion Lithography
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T.S. Gau, C.K. Chen, B.J. Lin, "The Image Characterization of Bubbles in water for 193-nm Immersion Lithography", J. Microlith., Microfab., Microsyst., Vol. 3, p 61-67, 2004.
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(2004)
J. Microlith., Microfab., Microsyst
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Gau, T.S.1
Chen, C.K.2
Lin, B.J.3
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46
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5444250026
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Immersion lithography and its impact on semiconductor manufacturing
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B.J. Lin, "Immersion lithography and its impact on semiconductor manufacturing", J. Microlith., Microfab., Microsyst., Vol. 3, p. 377-395, 2004.
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(2004)
J. Microlith., Microfab., Microsyst
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Lin, B.J.1
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47
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33745620217
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C.Y. Chang, D.C. Yu, J.H. Chen, C.H. Lin, B.J. Lin, J.W. Thackeray, V. Vohra, G. Wayton, T. Kurihara, A Novel Switchable BARC (SBARC) and Process to Improve Pattern Collapse and Defect Control, SPIE Proceedings, 6153, p. 61530M1-10, 2006.
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C.Y. Chang, D.C. Yu, J.H. Chen, C.H. Lin, B.J. Lin, J.W. Thackeray, V. Vohra, G. Wayton, T. Kurihara, "A Novel Switchable BARC (SBARC) and Process to Improve Pattern Collapse and Defect Control", SPIE Proceedings, Vol. 6153, p. 61530M1-10, 2006.
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48
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33745791736
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Watermark Defect Formation and Removal for Immersion Lithography
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C.Y. Chang, D.C. Yu, C.H. Lin, B.J. Lin, "Watermark Defect Formation and Removal for Immersion Lithography", SPIE Proceedings, Vol. 6154, p. 6154171-8, 2006.
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Chang, C.Y.1
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49
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33745790459
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C.Y. Chang, D.C. Yu, C.H. Lin, B.J. Lin, Development of Cleaning Process for Immersion Lithography, SPIE Proceedings, 6154, p. 61544R1-11, 2006.
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C.Y. Chang, D.C. Yu, C.H. Lin, B.J. Lin, "Development of Cleaning Process for Immersion Lithography", SPIE Proceedings, Vol. 6154, p. 61544R1-11, 2006.
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50
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35048891337
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Immersion Defect Reduction (I)-Analysis of Water Leaks in an Immersion Scanner
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F.J. Liang, H.Chang, L.H. Shiu, C.K. Chen, L.J. Chen, T.S. Gau, and B.J. Lin, "Immersion Defect Reduction (I)-Analysis of Water Leaks in an Immersion Scanner, SPIE Proceedings Vol. 6520-193, 2007.
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Liang, F.J.1
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51
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34248196225
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Immersion Defect Reduction (2) - The Formation Mechanism and Reduction of Patterned Defects
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Lin-Hung Shiu, Fu-Jye Liang, Hsing Chang, Chun-Kuang Chen, Li-Jui Chen, Tsai-Sheng Gau, and Burn J. Lin, "Immersion Defect Reduction (2) - The Formation Mechanism and Reduction of Patterned Defects, SPIE Proceedings Vol. 6520-38, 2007.
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52
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0001739418
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Soft x-ray reduction lithography using multilayer mirrors
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0001246252
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Reduction imaging at 14 nm using multilayer-coated optics: Printing of features smaller than 0.1 μm
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J.E. Bjorkholm, J. Bokor, L. Eichner, R.R. Freeman, T.E. Jewell, W.M. Mansfield, A.A. Macdowell, E.L. Raab, W.T. Silfvast, L.H. Szeto, D.M. Tennant, W.K. Waskiewicz, D.L. White, D.L. Windt, O.R. Wood II, and J.H. Brunning, "Reduction imaging at 14 nm using multilayer-coated optics: Printing of features smaller than 0.1 μm," J. Vac. Sci. Technol., Vol. B8, p. 1509, 1990.
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Macdowell, A.A.7
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Silfvast, W.T.9
Szeto, L.H.10
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Waskiewicz, W.K.12
White, D.L.13
Windt, D.L.14
Wood II, O.R.15
Brunning, J.H.16
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54
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35048895811
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Sober view on EUV lithography
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B.J. Lin, "Sober view on EUV lithography", J. Microlith., Microfab., Microsyst., Vol. 5, pp. 1537, 2006.
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Progress in the ASML EUV program
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H. Meiling, V. Banine, P. Kurz, N. Harned, "Progress in the ASML EUV program," SPIE Proceedings, Vol. 5374, p. 31-42, 2004.
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24644498099
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Development of the ASML EUV alpha demo tool
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