Influence of defects on the absorption edge of InN thin films: The band gap value

Physical Review B - Condensed Matter and Materials Physics

Volumn 76, Issue 3, 2007, Pages

  Thakur, J S ^a   Danylyuk, Y V ^a   Haddad, D ^b   Naik, V M ^c   Naik, R ^b   Auner, G W ^a  

^a Wayne State University   (United States)

^b WAYNE STATE UNIVERSITY   (United States)

^c UNIVERSITY OF MICHIGAN DEARBORN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 34447249484     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.76.035309     Document Type: Article

References (76)

1. S. C. Jain, M. Willander, J. Narayan, and R. Van Overstraeten, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.371971 87, 965 (2000).
2. V. Yu. Davydov, Phys. Status Solidi B PSSBBD 0370-1972 10.1002/1521-3951(200202)229:33.0.CO;2-O 229, R1 (2002);
3. J. Wu, W. Walukiewicz, K. M. Yu, J. W. Ager III, E. E. Haller, H. Lu, W. J. Schaff, Y. Saito, and Y. Nanishi, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1482786 80, 3967 (2002).
4. H. Sakai, T. Koide, H. Suzuki, M. Yamaguchi, S. Yamasaki, M. Koike, H. Amano, and I. Akasaki, Jpn. J. Appl. Phys., Part 2 JAPLD8 0021-4922 10.1143/JJAP.34.L1429 34, L1429 (1995).
5. K. Osamura, S. Naka, and Y. Murakami, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.322064 46, 3432 (1975).
6. T. Inushima, M. Higashiwaki, and T. Matsui, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.68.235204 68, 235204 (2003).
7. H. J. Hovel and J. J. Cuomo, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1654051 20, 71 (1972).
8. T. Inushima, M. Higashiwaki, T. Matsui, T. Takenobu, M. Motokawa, and T. Matsui, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.72.085210 72, 085210 (2005).
9. J. S. Thakur, R. Naik, V. M. Naik, D. Haddad, G. W. Auner, H. Lu, and W. J. Schaff, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.2158133 99, 023504 (2006).
10. K. Osamura, K. Nakajima, and Y. Murakai, Solid State Commun. SSCOA4 0038-1098 10.1016/S0038-1098(99)00412-3 11, 617 (1972).
11. T. L. Tansley and C. P. Foley, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.336906 59, 3241 (1986);
12. T. L. Tansley and C. P. Foley, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.337213 60, 2092 (1986).
13. K. L. Westra, R. P. Lawson, and M. J. Bret, J. Vac. Sci. Technol. A JVTAD6 0734-2101 10.1116/1.575280 6, 1730 (1988).
14. K. Ikuta, Y. Inoue, and O. Takai, Thin Solid Films THSFAP 0040-6090 10.1016/S0040-6090(98)01115-8 334, 49 (1998).
15. B. E. Foutz, S. K. O'Leary, M. Shur, and L. F. Eastman, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.370577 85, 7727 (1999).
16. K. S. A. Butcher, M. Wintrebert-Fouquet, P. P.-T. Chen, H. Timmers, and S. K. Shrestha, Mater. Sci. Semicond. Process. MSSPFQ 1369-8001 10.1016/j.mssp.2003.07.004 6, 351 (2003).
17. V. Yu. Davydov, Phys. Status Solidi B PSSBBD 0370-1972 10.1002/1521-3951(200204)230:23.0.CO;2-Z 230, R4 (2002).
18. J. Wu, W. Walukiewicz, W. Shan, K. M. Yu, J. W. Ager III, E. E. Haller, H. Lu, and W. J. Schaff, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.66. 201403 66, 201403 (R) (2002);
19. H. Lu, W. J. Schaff, H. Hwang, H. Wu, G. Koley, and L. F. Eastman, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1402649 79, 1489 (2001).
20. T. Matsuoka, H. Okamoto, M. Nakao, H. Harima, and E. Kurimoto, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1499753 81, 1246 (2002);
21. M. Higashiwaki and T. Matsui, J. Cryst. Growth JCRGAE 0022-0248 10.1016/j.jcrysgro.2004.05.045 269, 162 (2004).
22. T. V. Shubina, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.92. 117407 92, 117407 (2004).
23. O. Ambacher, J. Phys. D JPAPBE 0022-3727 10.1088/0022-3727/31/20/001 31, 2653 (1998).
24. I. Mahboob, T. D. Veal, C. F. McConville, H. Lu, and W. J. Schaff, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.92.036804 92, 036804 (2004);
25. I. Mahboob, T. D. Veal, L. F. J. Piper, C. F. McConville, H. Lu, W. J. Schaff, J. Furthmuller, and F. Bechstedt, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.69.201307 69, 201307 (R) (2004).
26. J. Furthmüller, P. H. Hahn, F. Fuchs, and F. Bechstedt, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.72.205106 72, 205106 (2005).
27. P. Perlin, J. Camassel, W. Knap, T. Taliercio, J. C. Chervin, T. Suski, I. Grzegory, and S. Porowski, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.114446 67, 2524 (1995).
28. A. Kasic, M. Schubert, Y. Saito, Y. Nanishi, and G. Wagner, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.65.115206 65, 115206 (2002).
29. J. S. Thakur, D. Haddad, V. M. Naik, R. Naik, G. W. Auner, H. Lu, and W. J. Schaff, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.71.115203 71, 115203 (2005).
30. S.-H. Wei, X. Nie, I. G. Batyrev, and S. B. Zhang, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.67.165209 67, 165209 (2003);
31. S.-H. Wei, X. Nie, I. G. Batyrev, and S. B. Zhang, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.68.199901 68, 199901 (E) (2003).
32. D. C. Look, H. Lu, W. J. Schaff, J. Jasinski, and Z. Liliental-Weber, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1432742 80, 258 (2002).
33. T. Araki, S. Ueta, K. Mizuo, T. Yamaguchi, Y. Saito, and Y. Nanishi, Phys. Status Solidi C ZZZZZZ 1610-1634 0, 2798 (2003).
34. F. Bechstedt, J. Furthmüller, O. Ambacher, and R. Goldhahn, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.93.269701 93, 269701 (2004).
35. T. V. Shubina, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.93. 269702 93, 269702 (2004);
36. T. V. Shubina Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.95. 209901 95, 209901 (E) (2005).
37. C. Persson, R. Ahuja, A. F. da Silva, and B. Johansson, J. Phys.: Condens. Matter JCOMEL 0953-8984 10.1088/0953-8984/13/40/309 13, 8945 (2001).
38. P. Carrier and S. H. Wei, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1849425 97, 033707 (2005).
39. F. Bechstedt, J. Furthmüller, M. Ferhat, L. K. Teles, L. M. R. Scolfaro, J. R. Leite, V. Yu. Davidov, O. Ambacher, and R. Goldhahn, Phys. Status Solidi A PSSABA 0031-8965 10.1002/pssa.200306164 195, 628 (2003).
40. H. C. Casey, Jr. and F. Stern, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.322626 47, 631 (1976).
41. J. Serre, A. Ghazali, and P. Leroux Hugon, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.23.1971 23, 1971 (1983).
42. J. Serre and A. Ghazali, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.28.4704 28, 4704 (1983).
43. K.-F. Berggren and B. E. Sernelius, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.24.1971 24, 1971 (1981).
44. T. S. Moss, Proc. Phys. Soc. London, Sect. B PPSBAP 0370-1301 10.1088/0370-1301/67/10/306 67, 775 (1954);
45. E. Burstein, Phys. Rev. PHRVAO 0031-899X 10.1103/PhysRev.93.632 93, 632 (1954).
46. D. B. Haddad, J. S. Thakur, V. M. Naik, G. W. Auner, R. Naik, and L. E. Wenger, in GaN and Related Alloys, MRS Symposia Proceedings No. 743, edited by, C. Wetzel,,, E. T. Yu,,, J. S. Speck,,, A. Rizzi,, and, Y. Arakawa, (Materials Research Society, Warrendale, PA, 2003), p. L111.22.
47. V. M. Naik, R. Naik, D. B. Haddad, J. S. Thakur, G. W. Auner, H. Lu, and W. J. Schaff, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1935031 86, 201913 (2005).
48. C. Stampfl, C. G. Van de Walle, D. Vogel, P. Kruger, and J. Pollmann, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.61.R7846 61, R7846 (2000);
49. S. Limpojumnong and C. G. Van de Walle, Phys. Status Solidi B PSSBBD 0370-1972 228 302 (2001).
50. T. L. Tansley and R. J. Egan, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.45.10942 45, 10942 (1992).
51. See, for example, G. H. Wannier, Elements of Solid State Theory (Cambridge University Press, Cambridge, England, 1959), p. 212.
52. D. Fritsch, H. Schmidt, and M. Grundmann, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.67.235205 67, 235205 (2003).
53. Y. C. Yeo, T. C. Chong, and M. F. Li, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.366847 83, 1429 (1998).
54. S. K. Pugh, D. J. Dugdale, S. Brand, and R. A. Abram, Semicond. Sci. Technol. SSTEET 0268-1242 10.1088/0268-1242/14/1/003 14, 23 (1999).
55. Y. Ishitani, Phys. Status Solidi B PSSBBD 0370-1972 10.1002/pssb. 200405097 241, 2849 (2004).
56. I. Hamberg, C. G. Granqvist, K.-F. Berggren, B. E. Sernelius, and L. Engstrom, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.30.3240 30, 3240 (1984).
57. C. F. Ting, T. K. Lee, and J. J. Quinn, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.34.870 34, 870 (1975).
58. T. M. Rice, Ann. Phys. (N.Y.) APNYA6 0003-4916 10.1016/0003-4916(65) 90234-4 31, 100 (1965).
59. L. Hedin, Phys. Rev. PRVAAH 0096-8250 10.1103/PhysRev.139.A796 139, A796 (1965);
60. J. J. Quinn and R. A. Ferrell, Phys. Rev. PRVAAH 0096-8250 10.1103/PhysRev.112.812 112, 812 (1958).
61. N. E. Christensen and I. Gorczyca, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.50.4397 50, 4397 (1994).
62. Y.-N. Xu and W. Y. Ching, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.48.4335 48, 4335 (1993).
63. D. Pines and P. Nozieres, The Theory of Quantum Liquids (Benjamin, New York, 1966), Vol. I.
64. S. DasSarma, V. M. Galitski, and Y. Zhang, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.69.125334 69, 125334 (2004).
65. A. A. Abrikosov, L. P. Gorkov, and I. E. Dzyaloshinski, Methods of Quantum Field Theory in Statistical Physics (Prentice-Hall, Englewood Cliffs, NJ, 1963), Sec. 39.
66. G. D. Mahan, Many-Particle Physics, 3rd ed. (Plenum, New York, 2000), Chap..
67. G. D. Mahan, Many-Particle Physics, 3rd ed. (Plenum, New York, 2000), p. 199.
68. C. Bungaro, K. Rapcewicz, and J. Bernholc, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.61.6720 61, 6720 (2000).
69. C. Persson, R. Ahuja, A. F. da Silva, and B. Johansson, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1504499 92, 3207 (2002).
70. D. Fritsch, H. Schmidt, and M. Grundmann, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.67.235205 67, 235205 (2003).
71. J. Wu, W. Walukiewicz, W. Shan, K. M. Yu, J. W. Ager III, S. X. Li, E. E. Haller, H. Lu, and W. J. Schaff, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1605815 94, 4457 (2003).
72. J. Edwards, K. Kawabe, G. Stevens, and R. J. Tredgold, Solid State Commun. SSCOA4 0038-1098 10.1016/0038-1098(65)90231-0 3, 99 (1965).
73. M. Morita, K. Tsubouchi, and N. Mikoshiba, Jpn. J. Appl. Phys., Part 1 JAPNDE 0021-4922 10.1143/JJAP.21.728 21, 728 (1982).
74. G. A. Cox, D. O. Cummings, K. Kawabe, and R. H. Tredgold, J. Phys. Chem. Solids JPCSAW 0022-3697 10.1016/0022-3697(67)90084-4 28, 543 (1968).
75. R. W. Francis and W. L. Worrell, J. Electrochem. Soc. JESOAN 0013-4651 10.1149/1.2132844 123, 430 (1976).
76. A. G. Bhuiyan, A. Hashimoto, and A. Yamamoto, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1595135 94, 2779 (2003).