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Volumn 269, Issue 1, 2004, Pages 162-166
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Estimation of band-gap energy of intrinsic InN from photoluminescence properties of undoped and Si-doped InN films grown by plasma-assisted molecular-beam epitaxy
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Author keywords
A3. Molecular beam epitaxy; B1. Nitrides; B2. Semiconducting III V materials; B2. Semiconducting indium compounds
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Indexed keywords
CARRIER CONCENTRATION;
CRYSTAL GROWTH;
DISLOCATIONS (CRYSTALS);
DOPING (ADDITIVES);
ELECTRON DIFFRACTION;
HEAT CONDUCTION;
MOLECULAR BEAM EPITAXY;
PHOTOLUMINESCENCE;
SILICON;
X RAY DIFFRACTION;
BAND-GAP ENERGY;
HIGH ELECTRON SATURATION;
RENORMALIZATION;
SEMICONDUCTING MATERIALS;
INDIUM;
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EID: 3342931415
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jcrysgro.2004.05.045 Document Type: Conference Paper |
Times cited : (39)
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References (14)
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