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Volumn 269, Issue 1, 2004, Pages 162-166

Estimation of band-gap energy of intrinsic InN from photoluminescence properties of undoped and Si-doped InN films grown by plasma-assisted molecular-beam epitaxy

Author keywords

A3. Molecular beam epitaxy; B1. Nitrides; B2. Semiconducting III V materials; B2. Semiconducting indium compounds

Indexed keywords

CARRIER CONCENTRATION; CRYSTAL GROWTH; DISLOCATIONS (CRYSTALS); DOPING (ADDITIVES); ELECTRON DIFFRACTION; HEAT CONDUCTION; MOLECULAR BEAM EPITAXY; PHOTOLUMINESCENCE; SILICON; X RAY DIFFRACTION;

EID: 3342931415     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2004.05.045     Document Type: Conference Paper
Times cited : (39)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.