Toward atom-by-atom assembly of compound semiconductor nano-structures: Mechanical atomic discrimination and atomic manipulation at room temperature

Current Nanoscience

Volumn 3, Issue 1, 2007, Pages 31-40

  Morita, Seizo ^a   Sugimoto, Yoshiaki ^a   Abe, Masayuki ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

Atom by atom assembly; Atom interchange manipulation; Atomic discrimination; Atomic force microscopy; Lateral atom manipulation; Site specific force spectroscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; NANOSTRUCTURES; TOPOGRAPHY;

ATOM-BY-ATOM ASSEMBLY; ATOM-INTERCHANGE MANIPULATION; ATOMIC DISCRIMINATION;

SEMICONDUCTOR MATERIALS;

GERMANIUM; NANOMATERIAL; SILICON; TIN;

CONTROLLED STUDY; MOLECULAR INTERACTION; OSCILLATION; PRIORITY JOURNAL; REVIEW; ROOM TEMPERATURE; SEMICONDUCTOR; SPECTROSCOPY; SYNTHESIS; TOPOGRAPHY;

EID: 33847260135     PISSN: 15734137     EISSN: None     Source Type: Journal    
DOI: 10.2174/157341307779940616     Document Type: Review

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