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Volumn 16, Issue 3, 2005, Pages

Imaging the restatom of the Ge(111)-c(2 × 8) surface with noncontact atomic force microscopy at room temperature

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHARGE TRANSFER; COMPOSITION; IMAGING TECHNIQUES; SCANNING TUNNELING MICROSCOPY; SURFACE STRUCTURE;

EID: 15844398998     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/16/3/013     Document Type: Conference Paper
Times cited : (15)

References (19)
  • 17
    • 12344269124 scopus 로고    scopus 로고
    • Non-contact atomic force microscopy study of the Sn/Si (111) mosaic phase
    • at press (doi:10.1016/j.apsusc.2004.09.012)
    • Sugimoto Y, Abe M, Yoshimoto K, Custance O, Yi I and Morita S 2004 Non-contact atomic force microscopy study of the Sn/Si (111) mosaic phase Appl. Surf. Sci. at press (doi:10.1016/j.apsusc.2004.09.012)
    • (2004) Appl. Surf. Sci.
    • Sugimoto, Y.1    Abe, M.2    Yoshimoto, K.3    Custance, O.4    Yi, I.5    Morita, S.6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.