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Volumn 16, Issue 3, 2005, Pages
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Imaging the restatom of the Ge(111)-c(2 × 8) surface with noncontact atomic force microscopy at room temperature
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CHARGE TRANSFER;
COMPOSITION;
IMAGING TECHNIQUES;
SCANNING TUNNELING MICROSCOPY;
SURFACE STRUCTURE;
NONCONTACT ATOMIC FORCE MICROSCOPY;
SPATIAL RESOLUTION;
SURFACE STRUCTURES;
TOPOGRAPHIC CONTRAST IMAGES;
GERMANIUM;
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EID: 15844398998
PISSN: 09574484
EISSN: None
Source Type: Journal
DOI: 10.1088/0957-4484/16/3/013 Document Type: Conference Paper |
Times cited : (15)
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References (19)
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