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Volumn 101, Issue 3, 2007, Pages

A molecular dynamics investigation of fluorocarbon based layer-by-layer etching of silicon and Si O2

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ETCHING; FLUOROCARBONS; ION BOMBARDMENT; MOLECULAR DYNAMICS; PASSIVATION;

EID: 33847129197     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2464192     Document Type: Article
Times cited : (79)

References (41)
  • 39
    • 33847105798 scopus 로고    scopus 로고
    • M. J. Frisch, GAUSSIAN98, Revision A.9, Gaussian, Inc., Pittsburgh, PA, 1998.
    • (1998)
    • Frisch, M.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.