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Volumn 16, Issue 1, 1998, Pages 233-238

Surface reaction of CF2 radicals for fluorocarbon film formation in SiO2/Si selective etching process

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[No Author keywords available]

Indexed keywords


EID: 0032358625     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.580977     Document Type: Article
Times cited : (59)

References (23)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.