Mosfet channel length: extraction and interpretation

IEEE Transactions on Electron Devices

Volumn 47, Issue 1, 2000, Pages 160170-

  Taur, Yuan ^a,b  

^a IEEE   (United States)

^b IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

Integrated circuits; Mosfet's; Semiconductor devices; Transistors

Indexed keywords

EID: 33747094504     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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