Measuring the effective channel length of MOSFETs

IEEE Circuits and Devices Magazine

Volumn 6, Issue 6, 1990, Pages 33-38

  Ng, Kwok K ^a   Brews, John R ^b  

^a LUCENT TECHNOLOGIES   (United States)

^b UNIVERSITY OF ARIZONA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFUSION; ELECTRIC MEASUREMENTS; SEMICONDUCTOR MATERIALS - CHARGE CARRIERS;

CHARGE MOBILITY; CURRENT EQUATION; ELECTRON CONCENTRATION; MOSFET EFFECIVE CHANNEL LENGTH;

SEMICONDUCTOR DEVICES, MOSFET;

EID: 0025511663     PISSN: 87553996     EISSN: None     Source Type: Journal    
DOI: 10.1109/101.100256     Document Type: Article

References (17)

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